Title :
Simulation of Coulomb interactions in electron projection lithography using scattering contrast
Author :
Yamashita, H. ; Munro, E. ; Rouse, J. ; Nomura, E. ; Kobinata, H. ; Nakajima, K. ; Nozue, H.
Author_Institution :
ULSI Device Dev. Lab., NEC Corp., Sagamihara, Japan
Abstract :
Electron projection lithography (EPL), such as PREVAIL and SCALPEL, are among the candidates for next generation lithography. We modified the discrete Coulomb interaction simulator BOERSCH to be capable of incorporating the treatment of mask-scattered electrons into the simulation domain. Annular apertures of arbitrary number and size also can be set as the limiting aperture in addition to the usual round shape. Using this simulator, not only the resolution but also the performance of the SCALPEL GHOST proximity effect correction (PEC) can be evaluated. Therefore, this modified BOERSCH can provide almost perfect functions necessary for the EPL process development.
Keywords :
electron beam lithography; proximity effect (lithography); semiconductor process modelling; BOERSCH; Coulomb interaction; GHOST; PREVAIL; SCALPEL; computer simulation; electron projection lithography; mask scattering contrast; next generation lithography; proximity effect correction; resolution; Apertures; Electron beams; Electron optics; Histograms; Laboratories; Lithography; National electric code; Optical scattering; Page description languages; Ultra large scale integration;
Conference_Titel :
Microprocesses and Nanotechnology Conference, 2000 International
Conference_Location :
Tokyo, Japan
Print_ISBN :
4-89114-004-6
DOI :
10.1109/IMNC.2000.872659