DocumentCode :
2473353
Title :
Fundamental study of "matrix pattern imaging", EB system
Author :
Tanimoto, S. ; Someda, Y. ; Okumura, M. ; Ohta, H. ; Sohda, Y. ; Saito, N.
Author_Institution :
Central Res. Lab., Hitachi Ltd., Tokyo, Japan
fYear :
2000
fDate :
11-13 July 2000
Firstpage :
144
Lastpage :
145
Abstract :
A new approach of electron beam lithography is proposed for high-throughput exposure systems. In an exposure system using this approach, the electron sources are arranged in a matrix so that they produce an electron beam in the shape of a circuit pattern, which is focused on the target. We call our approach "matrix pattern imaging (MPI)". In such a system, the electron sources play a key role, and the MIM (metal-insulator-metal) cathode is a promising candidate for them. We therefore compared its properties to those of other candidates. We also performed simple projection experiments and evaluated the merits of such a system.
Keywords :
MIM devices; cathodes; electron beam lithography; electron sources; MIM cathode; electron beam lithography; electron source; matrix pattern imaging; projection exposure system; Cathodes; Circuits; Electrodes; Electron beams; Electron sources; Large scale integration; Lithography; Shape; Throughput; Writing;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Microprocesses and Nanotechnology Conference, 2000 International
Conference_Location :
Tokyo, Japan
Print_ISBN :
4-89114-004-6
Type :
conf
DOI :
10.1109/IMNC.2000.872665
Filename :
872665
Link To Document :
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