• DocumentCode
    2473389
  • Title

    Implementation of low Vgs (1.8V) 12V RF-LDMOS for high-frequency DC-DC converter applications

  • Author

    Choi, Yong-Keon ; Park, Il-Yong ; Oh, Hee-Sung ; Lee, Wook ; Kim, Nam-Joo ; Yoo, Kwang-Dong

  • Author_Institution
    Analog Foundry Bus. Unit, Dongbu HiTek, Bucheon, South Korea
  • fYear
    2012
  • fDate
    3-7 June 2012
  • Firstpage
    125
  • Lastpage
    128
  • Abstract
    A 12V low Vgs (1.8V) RF-N/PLDMOS have been successfully implemented on the 0.18 μm analog CMOS process without thermal budget addition. N- and P-ch LDMOS needs additional body and drift implants, respectively. A short channel length and a small overlap of gate-to-drain were accomplished by the optimization of implant conditions for the source halo and the drift region which is followed by the gate formation with 30 Å gate oxide. Cut-off frequency 37.2GHz and 12.9GHz each for NLDMOS and PLDMOS were achieved with breakdown voltage of 20V. The long-term wafer level HCI test result showed Idlin shift under 10% after 150Ksec stress at Vds=12V and Vgs=1.8V.
  • Keywords
    DC-DC power convertors; MOS integrated circuits; CMOS process; N-LDMOS; NLDMOS; P-ch LDMOS; PLDMOS; RF-LDMOS; breakdown voltage; frequency 12.9 GHz; frequency 37.2 GHz; high-frequency DC-DC converter applications; lateral double-diffused MOS; long-term wafer level test; voltage 1.8 V; voltage 12 V; voltage 20 V; CMOS process; Implants; Logic gates; Radio frequency; Reliability; Stress; Transmission line measurements;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Power Semiconductor Devices and ICs (ISPSD), 2012 24th International Symposium on
  • Conference_Location
    Bruges
  • ISSN
    1943-653X
  • Print_ISBN
    978-1-4577-1594-5
  • Electronic_ISBN
    1943-653X
  • Type

    conf

  • DOI
    10.1109/ISPSD.2012.6229039
  • Filename
    6229039