Title :
Voltage drops, sawtooth oscillations and HF bursts in Breakdown Current and Voltage waveforms during UIS experiments
Author :
Irace, A. ; Spirito, P. ; Riccio, M. ; Breglio, G.
Author_Institution :
Dept. of Biomed., Electron. & Telecommun. Eng., Univ. of Naples Federico II, Naples, Italy
Abstract :
The aim of this paper is to analyze the typical voltage and current waveforms of UIS test in order to find signature of uneven current conduction behavior. This information could help the identification of phenomena that can eventually lead to device failure, reduce its capability of sustaining high currents in avalanche operation or impair long-term device reliability.
Keywords :
MOSFET; electric breakdown; failure analysis; semiconductor device reliability; semiconductor device testing; HF bursts; MOSFET; UIS test experiments; avalanche breakdown; breakdown current; current conduction behavior; current waveforms; device failure; impair long-term device reliability; sawtooth oscillations; unclamped inductive switching test; voltage drops; voltage waveforms; Avalanche breakdown; Current distribution; Heating; Inductors; Oscillators; Resistance; Avalanche Breakdown; Current filamentation; Infrared Thermography; Negative Differential Resistance;
Conference_Titel :
Power Semiconductor Devices and ICs (ISPSD), 2012 24th International Symposium on
Conference_Location :
Bruges
Print_ISBN :
978-1-4577-1594-5
Electronic_ISBN :
1943-653X
DOI :
10.1109/ISPSD.2012.6229049
