Title :
RDA for automatic airport recognition on FLIR image
Author :
Liu, Wei ; Tian, Jinwen ; Chen, Xinwu
Author_Institution :
State Key Lab. for Multi-Spectral Inf. Process. Technol., Huazhong Univ. of Sci. & Technol., Wuhan
Abstract :
This paper studies Regularized Discriminant Analysis (RDA) in the context of automatic airport recognition system for Forward-Looking infrared images (FLIR). When the within class covariance of training sample are sometimes singular, Linear and Quadratic discriminant analysis (LDA & QDA) does not necessarily give the best performance. Alternatives to the usual plug-in (maximum likelihood) estimates for the covariance matrices are proposed, which is called two-parameter RDA in this paper. Here, we check two-parameter RDA availability and compare its performance in our recognition system to other classifiers, such as KNN, LDA, QDA etc. The experimental results demonstrate the efficacy of the two parameters RDA classifier for automatic airport recognition in FLIR images. On the basis of RDA classifier, our proposed recognition system frame was concluded to be a highly prospective candidate for real time ATR system on airport and can also be used on other ATR system, such as building, power plant etc.
Keywords :
airports; covariance matrices; image classification; infrared imaging; object recognition; FLIR image; automatic airport recognition; class covariance; covariance matrix; forward-looking infrared images; image classification; regularized discriminant analysis; Airports; Availability; Covariance matrix; Image analysis; Image recognition; Infrared imaging; Linear discriminant analysis; Maximum likelihood estimation; Performance analysis; Real time systems; airport recognition; infrared image; singularity; two-parameter RDA; within-class covariance;
Conference_Titel :
Intelligent Control and Automation, 2008. WCICA 2008. 7th World Congress on
Conference_Location :
Chongqing
Print_ISBN :
978-1-4244-2113-8
Electronic_ISBN :
978-1-4244-2114-5
DOI :
10.1109/WCICA.2008.4592845