• DocumentCode
    2473715
  • Title

    Al dot hexagonal array formation using anodic oxidation and selective etching

  • Author

    Murakami, Y. ; Shingubara, S. ; Sakaue, H. ; Talahagi, T.

  • Author_Institution
    Dept. of Electr. Eng., Hiroshima Univ., Japan
  • fYear
    2000
  • fDate
    11-13 July 2000
  • Firstpage
    178
  • Lastpage
    179
  • Abstract
    Fabrication of nanoscale dot array are intensively required for realizing ultimately dense memory devices as well as quantum devices based on single-electron phenomena. However, there is an inherent problem for patterning time when pattern size shrinks below a few tens of nm, by lithographic methods based on beam technology. Patterning methods using self-organization phenomena provide alternative approach for realization of ordered array of nanostructure in relatively short time with a significant cost reduction. Al anodic oxidation has a high capability for realizing an extremely highly ordered array of nano-hole, so that there have been several attempts to realize nanowire arrays. The present study investigates formation of nano-dot array on semiconductor substrate using Al anodic oxidation.
  • Keywords
    aluminium; anodisation; etching; nanostructured materials; quantum dots; Al; Al anodic oxidation; Al dot hexagonal array formation; anodic oxidation; dense memory devices; lithographic methods; ordered array of nanostructure; patterning methods; patterning time; selective etching; self-organization phenomena; single-electron phenomena; Chemicals; Fabrication; Lattices; Nanoscale devices; Nearest neighbor searches; Oxidation; Quantum dots; Substrates; US Department of Transportation; Wet etching;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Microprocesses and Nanotechnology Conference, 2000 International
  • Conference_Location
    Tokyo, Japan
  • Print_ISBN
    4-89114-004-6
  • Type

    conf

  • DOI
    10.1109/IMNC.2000.872691
  • Filename
    872691