Title :
Perturbation based modeling strategy for weakly coupled interconnects
Author_Institution :
Apple Inc., Cupertino, CA, USA
Abstract :
Coupling between two general interconnect structures, each viewed as the aggressor and victim sub-systems, respectively, are modeled with a 4-port network. A new method is introduced to estimate the coupling effects on the victim subsystem with known activities in the aggressor sub-system. It is verified with an idealized example, and is illustrated with a real-world PCB design scenario for noise prediction.
Keywords :
integrated circuit interconnections; perturbation theory; printed circuits; 4-port network; PCB design; aggresor subsystem; interconnect structures; noise prediction; perturbation based modeling strategy; printed circuit board; victim subsystems; weakly coupled interconnects; Circuit noise; Circuit simulation; Coupling circuits; Crosstalk; Electromagnetic modeling; Integrated circuit interconnections; Printed circuits; Scattering parameters; Signal design; Voltage; coupled interconnect; crosstalk; perturbation;
Conference_Titel :
Electrical Performance of Electronic Packaging and Systems, 2009. EPEPS '09. IEEE 18th Conference on
Conference_Location :
Portland, OR
Print_ISBN :
978-1-4244-4447-2
Electronic_ISBN :
978-1-4244-5646-8
DOI :
10.1109/EPEPS.2009.5338438
