Perturbation based modeling strategy for weakly coupled interconnects

Author

Shi, Hao

Author_Institution

Apple Inc., Cupertino, CA, USA

fYear

2009

fDate

19-21 Oct. 2009

Firstpage

215

Lastpage

218

Abstract

Coupling between two general interconnect structures, each viewed as the aggressor and victim sub-systems, respectively, are modeled with a 4-port network. A new method is introduced to estimate the coupling effects on the victim subsystem with known activities in the aggressor sub-system. It is verified with an idealized example, and is illustrated with a real-world PCB design scenario for noise prediction.

Keywords

integrated circuit interconnections; perturbation theory; printed circuits; 4-port network; PCB design; aggresor subsystem; interconnect structures; noise prediction; perturbation based modeling strategy; printed circuit board; victim subsystems; weakly coupled interconnects; Circuit noise; Circuit simulation; Coupling circuits; Crosstalk; Electromagnetic modeling; Integrated circuit interconnections; Printed circuits; Scattering parameters; Signal design; Voltage; coupled interconnect; crosstalk; perturbation;

fLanguage

English

Publisher

ieee

Conference_Titel

Electrical Performance of Electronic Packaging and Systems, 2009. EPEPS '09. IEEE 18th Conference on

Conference_Location

Portland, OR

Print_ISBN

978-1-4244-4447-2

Electronic_ISBN

978-1-4244-5646-8

Type

conf

DOI

10.1109/EPEPS.2009.5338438

Filename

5338438

Link To Document

https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=2473824