Title :
The impact of guard trace with open stub on time-domain waveform in high-speed digital circuits
Author :
Chiu, Po-Wei ; Shiue, Guang-Hwa
Author_Institution :
Dept. of Electron. Eng., Chung Yuan Christian Univ., Chungli, Taiwan
Abstract :
Grounded guard traces are increasingly utilized to mitigate the crosstalk noise interference of the printed circuit board or package. This article discusses how the couple microstrip line inserted guard trace with stub affects the crosstalk noise. The guard trace with an open stub seriously degrades the performance of the coupled line with respect to signal integrity (SI) while far-end crosstalk noise will still occurs for stripline structure. Additionally, an analytical formula is proposed to approximate the extra crosstalk noise which is caused by guard trace stub.
Keywords :
digital circuits; microstrip lines; printed circuits; analytical formula; couple microstrip line; crosstalk noise interference; grounded guard trace; guard trace stub; high-speed digital circuits; package; printed circuit board; signal integrity; stripline structure; time-domain waveform; Coupling circuits; Crosstalk; Degradation; Digital circuits; Interference; Microstrip; Packaging; Printed circuits; Stripline; Time domain analysis;
Conference_Titel :
Electrical Performance of Electronic Packaging and Systems, 2009. EPEPS '09. IEEE 18th Conference on
Conference_Location :
Portland, OR
Print_ISBN :
978-1-4244-4447-2
Electronic_ISBN :
978-1-4244-5646-8
DOI :
10.1109/EPEPS.2009.5338439
