DocumentCode
2474016
Title
Remote-plasma-enhanced etching of silicon using trifluoro-acetyl-fluoride gas
Author
Saito, Y. ; Yamazaki, H. ; Mouri, I.
Author_Institution
Dept. of Electr. Eng. & Electron., Seikei Univ., Tokyo, Japan
fYear
2000
fDate
11-13 July 2000
Firstpage
204
Lastpage
205
Abstract
Recently, it is predicted that most of carbon fluorides, nitrogen trifluoride and sulfur hexafluoride, which are widely used to etch silicon related materials and extremely stable, can induce greenhouse effects. In this study, we demonstrate the acceleration of the etching reaction between silicon and the trifluoroacetyl fluoride (CF/sub 3/COF) gas, using remote-plasma-excitation at room temperature. The CF/sub 3/COF is appropriately reactive against water and will be decomposed to trifluoroacetic acid and hydrogen fluoride. Although the value of the global warming potential (GWP) of the CF/sub 3/COF has not been clarified until this time, we believe that this gas would not induce greenhouse effects. In this presentation, the effects of additional oxygen on the etching reaction are mainly investigated.
Keywords
elemental semiconductors; environmental factors; organic compounds; silicon; sputter etching; Si; global warming potential; greenhouse effect; remote plasma enhanced etching; silicon; trifluoroacetyl fluoride gas; Atom optics; Etching; Optical films; Optical pumping; Optical surface waves; Plasma applications; Plasma measurements; Plasma temperature; Silicon; Stimulated emission;
fLanguage
English
Publisher
ieee
Conference_Titel
Microprocesses and Nanotechnology Conference, 2000 International
Conference_Location
Tokyo, Japan
Print_ISBN
4-89114-004-6
Type
conf
DOI
10.1109/IMNC.2000.872710
Filename
872710
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