Title :
Pseudo-random behavioral ATPG
Author :
Courbis, Anne-Lise ; Santucci, Jean-Francois
Author_Institution :
LG12P, EMA-EERIE, Nimes, France
Abstract :
This paper deals with a new approach for the Automatic Test Pattern Generation (ATPG) of circuits described from a behavioral point of view in VHDL. This approach is based on a pseudo-random process characterized by the fact that criteria for computing the test length and evaluating the quality of the generated data come from the field of software engineering. This paper presents the bases of this new approach in the field of hardware engineering and some experimental results
Keywords :
automatic testing; fault diagnosis; hardware description languages; logic testing; VHDL; pseudo-random behavioral ATPG; Automatic test pattern generation; Circuit faults; Circuit testing; Electrical fault detection; Fault detection; Hardware; Random number generation; Software engineering; Software testing; Test pattern generators;
Conference_Titel :
VLSI, 1995. Proceedings., Fifth Great Lakes Symposium on
Conference_Location :
Buffalo, NY
Print_ISBN :
0-8186-7035-5
DOI :
10.1109/GLSV.1995.516051
