DocumentCode :
2474157
Title :
Nondestructive Observation of Microdefects in In-Doped-GaAs by Photo-Thermal-Radiation Microscope
Author :
Mikoshiba, N. ; Tsubouchi, K. ; Akutsu, Y.
fYear :
1987
fDate :
14-16 Oct. 1987
Firstpage :
1183
Lastpage :
1186
Keywords :
Acoustic beams; Gallium arsenide; Infrared detectors; Microscopy; Radiation detectors; Silicon radiation detectors; Surface emitting lasers; Surface topography; Temperature sensors; Wavelength measurement;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
IEEE 1987 Ultrasonics Symposium
Conference_Location :
Denver, Colorado, USA
Type :
conf
DOI :
10.1109/ULTSYM.1987.199142
Filename :
1536082
Link To Document :
https://search.ricest.ac.ir/dl/search/defaultta.aspx?DTC=49&DC=2474157
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