Title :
Improving module performance and reliability in power electronic applications by monolithic integration of RC-snubbers
Author :
Erlbacher, T. ; Schwarzmann, H. ; Bauer, A.J. ; Berberich, S.E. ; Dorp, J. Vom ; Frey, L.
Author_Institution :
Fraunhofer IISB, Erlangen, Germany
Abstract :
Monolithic integration of RC snubbers in power electronic applications offers great opportunities. The presented devices provide tight tolerances and enable high integration densities. Especially, the incorporation into power modules enables reduction of electromagnetic interferences in accordance with reliable lifetime predictions.
Keywords :
electromagnetic interference; power electronics; reliability; snubbers; RC-snubbers; electromagnetic interference; monolithic integration; power electronic application; power module; reliability; Capacitance; Capacitors; Electromagnetic interference; Reliability; Resistance; Silicon; Snubbers; RC-snubber; dielectric reliability; monolithic integration; power module;
Conference_Titel :
Power Semiconductor Devices and ICs (ISPSD), 2012 24th International Symposium on
Conference_Location :
Bruges
Print_ISBN :
978-1-4577-1594-5
Electronic_ISBN :
1943-653X
DOI :
10.1109/ISPSD.2012.6229078
