Title :
Direct observation technique of XLPE morphology through the FE-STEM method
Author :
Ishida, Masayoshi ; Okamoto, Tatsuki
Author_Institution :
Central Res. Inst. of Electric Power Ind., Nagasaki, Japan
Abstract :
The direct observation of the microscopic morphology of cross-linked polyethylene (XLPE) insulations, performed by a field-emission transmission scanning electron microscope (FE-STEM), which combines a new field emission-type electron source and electron beam scanning. It has been found that the spherulite structures (subtle density difference) in unstained XLPE insulations can be observed in terms of the difference in contrast by means of the FE-STEM method. The density of spherulite structures in the XLPE insulation is higher than that of the regions between spherulites. These spherulite structures are dispersed and do not have clear borders
Keywords :
XLPE insulation; electron field emission; insulation testing; polymer structure; scanning-transmission electron microscopy; FE-STEM method; XLPE morphology; cross-linked polyethylene; density difference; field-emission transmission scanning electron microscope; insulations; microscopic morphology; spherulite structures; unstained XLPE insulations; Acceleration; Atomic beams; Atomic measurements; Electron beams; Electron sources; Energy resolution; Iron; Morphology; Probes; Voltage;
Conference_Titel :
Electrical Insulation and Dielectric Phenomena, 1993. Annual Report., Conference on
Conference_Location :
Pocono Manor, PA
Print_ISBN :
0-7803-0966-9
DOI :
10.1109/CEIDP.1993.378882
