Title :
Fluorescence lifetime determination for application in microscopy
Author :
Boddeke, F.R. ; Schenkeveld, V. M Erik ; vanGeest, L.K. ; Young, Ian T.
Author_Institution :
Fac. of Appl. Phys., Delft Univ. of Technol., Netherlands
Abstract :
A recent development in fluorescence microscopy is the fluorescence lifetime imaging microscopy. In this type of microscopy the lifetime of the excited state of the fluorescent molecules is of interest rather than the amount of light emitted. By evaluating the response (emission light) of the system (fluorescent molecules) to a specific input signal (excitation light) the fluorescent lifetime can be determined. Different input signals are possible including light pulses, the sinusoidally modulated light and the white-noise modulated light. In this paper we describe two systems under development in our laboratory based on the latter two input signals
Keywords :
autoregressive moving average processes; fluorescence; optical microscopy; optical modulation; parameter estimation; radiative lifetimes; ARMAX estimator; emission light; excitation light; fluorescence lifetime; fluorescence microscopy; fluorescent molecules; light pulses; parameter estimation; sinusoidally modulated light; white-noise modulated light; Delay; Fluorescence; Lighting; Microscopy; Optical filters; Optical modulation; Phase detection; Phase modulation; Pulse modulation; Stimulated emission;
Conference_Titel :
Pattern Recognition, 1996., Proceedings of the 13th International Conference on
Conference_Location :
Vienna
Print_ISBN :
0-8186-7282-X
DOI :
10.1109/ICPR.1996.547289