• DocumentCode
    2474574
  • Title

    The mechanism of degradation of polyethylene in a high electrical field

  • Author

    Kaminaga, K. ; Suzuki, T. ; Uozumi, T. ; Haga, T. ; Yasuda, N. ; Fukui, T.

  • Author_Institution
    The Tokyo Electric Power Co., Inc., Japan
  • fYear
    1993
  • fDate
    17-20 Oct 1993
  • Firstpage
    666
  • Lastpage
    671
  • Abstract
    A chemical analysis of LDPE (low-density polyethylene) applied above and below the luminescence inception voltage was performed. The authors also examined the time dependence of the luminescence intensity and the spectrum of the luminescence, considering the mechanism of degradation of LDPE in a high electric field. The luminescence inception stress is about 60kV/mm if the stress mitigating effect due to the space charge is disregarded. It was lower by about 200kV/mm than the electrical tree inception stress. When voltage above the luminescence inception voltage was applied to LDPE, a free radical and an oxide were detected by ESR (electron spin resonance) and XPS (X-ray photoelectron spectroscopy), respectively. The time dependence of the luminescence intensity under constant AC voltage was examined. The luminescence intensity is shown to be stable in the initial stage. However, an intense light was observed after a certain period of voltage application
  • Keywords
    X-ray photoelectron spectra; chemical analysis; high field effects; luminescence; paramagnetic resonance; polyethylene insulation; ESR; LDPE; XPS; chemical analysis; constant AC voltage; degradation mechanism; electrical tree inception stress; free radical; high electric field; high electrical field; luminescence inception stress; luminescence inception voltage; oxide; polyethylene; space charge; stress mitigating effect; time dependence; voltage application; Chemical analysis; Degradation; Luminescence; Paramagnetic resonance; Polyethylene; Space charge; Stress; Voltage; X-ray detection; X-ray detectors;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electrical Insulation and Dielectric Phenomena, 1993. Annual Report., Conference on
  • Conference_Location
    Pocono Manor, PA
  • Print_ISBN
    0-7803-0966-9
  • Type

    conf

  • DOI
    10.1109/CEIDP.1993.378896
  • Filename
    378896