Title :
Modeling of IC power supply and I/O ports from measurements
Author :
Stievano, I.S. ; Rigazio, L. ; Maio, I.A. ; Girardi, A. ; Izzi, R. ; Vitale, F. ; Lessio, T.
Author_Institution :
Politec. di Torino, Torino, Italy
Abstract :
This paper addresses the generation of behavioral models of digital ICs for signal and power integrity simulations. The proposed models are obtained by external port measurements and by the combined application of specialized state-of-the-art modeling techniques. The proposed approach is demonstrated on the I/O buffers and the core power supply ports of a commercial 90 nm flash memory.
Keywords :
digital integrated circuits; integrated circuit modelling; power supply circuits; I/O buffers; I/O ports; IC power supply; behavioral models; core power supply ports; digital IC; external port measurements; power integrity simulations; signal integrity simulations; Digital integrated circuits; Flash memory; Impedance; Integrated circuit modeling; Integrated circuit testing; Logic testing; Power generation; Power measurement; Power supplies; Research and development;
Conference_Titel :
Electrical Performance of Electronic Packaging and Systems, 2009. EPEPS '09. IEEE 18th Conference on
Conference_Location :
Portland, OR
Print_ISBN :
978-1-4244-4447-2
Electronic_ISBN :
978-1-4244-5646-8
DOI :
10.1109/EPEPS.2009.5338470
