Title :
Photo-stimulated discharge of highly insulating polymers (PTFE and PETP)
Author :
Camacho Gonzalez, F.C. ; Mellinger, A. ; Gerhard-Multhaupt, R. ; Santos, L.E. ; Faria, R.M.
Author_Institution :
ACMP, Univ. of Potsdam, Germany
Abstract :
Photo-stimulated discharge (PSD) spectroscopy of polytetrafluoroethylene (PTFE) and polyethylene terephthalate (PETP) films volume- and surface-charged by either corona discharge or a monoenergetic electron beam was performed in order to investigate the mechanism(s) of charge storage and to determine trap depths. The samples were irradiated with monochromatic light from a Xenon arc lamp (photon energies of 3 - 6.2 eV) at constant temperature. Experimental results indicate that the threshold energy for the generation of a photocurrent depends on factors like film material, contact between sample and electrodes, and electrode material. Space-charge profiles determined with the piezoelectrically generated pressure-step (PPS) method show quantitative depopulation of near-surface charges. Partial detrapping of volume charge was also observed. Experimental results indicate that apparent detrapping can sometimes be attributed to photo-injection and exciton generation with subsequent charge compensation.
Keywords :
electron beam effects; electron traps; excitons; photoconductivity; polymer films; surface charging; 3 to 6.2 eV; PETP; PTFE; Xe arc lamp; charge compensation; charge storage; corona discharge; exciton generation; highly insulating polymers; monochromatic light irradiation; monoenergetic electron beam; near-surface charges; partial detrapping; photo-stimulated discharge; photocurrent; piezoelectrically generated pressure-step method; polyethylene terephthalate; polytetrafluoroethylene; threshold energy; trap depths; Corona; Electrodes; Electron beams; Electron traps; Plastic films; Plastic insulation; Polyethylene; Polymers; Spectroscopy; Surface discharges;
Conference_Titel :
Electrical Insulation and Dielectric Phenomena, 2002 Annual Report Conference on
Print_ISBN :
0-7803-7502-5
DOI :
10.1109/CEIDP.2002.1048865