• DocumentCode
    2474770
  • Title

    A fast 600-V Tandem PiN Schottky (TPS) rectifier with ultra-low on-state voltage

  • Author

    Hsu, Wesley Chih-Wei ; Udrea, Florin ; Chang, Winnie ; Chen, Max

  • Author_Institution
    R&D Dept., Vishay Gen. Semicond. Taiwan, Taipei, Taiwan
  • fYear
    2012
  • fDate
    3-7 June 2012
  • Firstpage
    377
  • Lastpage
    380
  • Abstract
    The Tandem PiN Schottky (TPS) rectifier features lowly-doped p-layers in both active and termination regions, and is applied in 600-V rating for the first time. In the active region, the Schottky contact is in series connection with a transparent p-layer, leading to a superior forward performance than the conventional diodes. In addition, due to the benefit of moderate hole injection from the p-layer, the TPS offers a better trade-off between the on-state voltage and the switching speed. The active p-layer also helps to stabilise the Schottky contact, and hence the electrical data distributions are more concentrated. Regarding the floating p-layer in the termination region, its purpose is to reduce the peak electric fields, and the TPS demonstrates a high breakdown voltage with a compact termination width, less than 70% of the state-of-the-art devices on the market. Experimental results have shown that the 600-V TPS rectifier has an ultra-low on-state voltage of 0.98 V at 250 A/cm2, a fast turn-off time of 75 ns by the standard RG1 test (IF=0.5A, IR=1A, and IRR=0.25A) and a breakdown voltage over 720 V. It is noteworthy that the p-layers in the active and termination regions can be formed at no extra cost for the use of self-alignment process.
  • Keywords
    Schottky diodes; electric breakdown; p-i-n diodes; power semiconductor diodes; rectifying circuits; Schottky contact; active p-layer; active region; breakdown voltage; self-alignment process; tandem pin Schottky rectifier; termination region; ultra low on-state voltage; voltage 600 V; Current density; Performance evaluation; Rectifiers; Schottky barriers; Temperature; Temperature measurement; Voltage measurement;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Power Semiconductor Devices and ICs (ISPSD), 2012 24th International Symposium on
  • Conference_Location
    Bruges
  • ISSN
    1943-653X
  • Print_ISBN
    978-1-4577-1594-5
  • Electronic_ISBN
    1943-653X
  • Type

    conf

  • DOI
    10.1109/ISPSD.2012.6229100
  • Filename
    6229100