• DocumentCode
    2474893
  • Title

    Insulator damages related to charge detrapping

  • Author

    Le Gressus, C. ; Blaise, G.

  • Author_Institution
    Centre D´´Etudes de Bruyeres-le-Chatel, France
  • fYear
    1993
  • fDate
    17-20 Oct 1993
  • Firstpage
    574
  • Lastpage
    579
  • Abstract
    It is shown that a critical space charge variation is the cause of insulator sample damage ranging from atom size to macroscopic size. This finding has implications for space charge characterization. Correlation of the space charge characteristics to breakdown strength requires the critical conditions for initiating breakdown. These conditions are related to such material intrinsic parameters as the trap energy distribution, the trap spatial distribution, the schubweg, and the modification of the free energy of the charged sample. The crucial point is therefore not how to measure the charge distribution but how to characterize trapping/detrapping critical parameters
  • Keywords
    electric breakdown; electron traps; free energy; space charge; atom size; breakdown strength; charge detrapping; critical space charge variation; free energy; insulator sample damage; macroscopic size; material intrinsic parameters; schubweg; space charge characterization; trap energy distribution; trap spatial distribution; Corona; Electric breakdown; Electron beams; Electron traps; Electrostatic discharge; Insulation; Mechanical energy; Plasma temperature; Space charge; Surface discharges;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electrical Insulation and Dielectric Phenomena, 1993. Annual Report., Conference on
  • Conference_Location
    Pocono Manor, PA
  • Print_ISBN
    0-7803-0966-9
  • Type

    conf

  • DOI
    10.1109/CEIDP.1993.378911
  • Filename
    378911