Title :
Insulator damages related to charge detrapping
Author :
Le Gressus, C. ; Blaise, G.
Author_Institution :
Centre D´´Etudes de Bruyeres-le-Chatel, France
Abstract :
It is shown that a critical space charge variation is the cause of insulator sample damage ranging from atom size to macroscopic size. This finding has implications for space charge characterization. Correlation of the space charge characteristics to breakdown strength requires the critical conditions for initiating breakdown. These conditions are related to such material intrinsic parameters as the trap energy distribution, the trap spatial distribution, the schubweg, and the modification of the free energy of the charged sample. The crucial point is therefore not how to measure the charge distribution but how to characterize trapping/detrapping critical parameters
Keywords :
electric breakdown; electron traps; free energy; space charge; atom size; breakdown strength; charge detrapping; critical space charge variation; free energy; insulator sample damage; macroscopic size; material intrinsic parameters; schubweg; space charge characterization; trap energy distribution; trap spatial distribution; Corona; Electric breakdown; Electron beams; Electron traps; Electrostatic discharge; Insulation; Mechanical energy; Plasma temperature; Space charge; Surface discharges;
Conference_Titel :
Electrical Insulation and Dielectric Phenomena, 1993. Annual Report., Conference on
Conference_Location :
Pocono Manor, PA
Print_ISBN :
0-7803-0966-9
DOI :
10.1109/CEIDP.1993.378911