DocumentCode
2474893
Title
Insulator damages related to charge detrapping
Author
Le Gressus, C. ; Blaise, G.
Author_Institution
Centre D´´Etudes de Bruyeres-le-Chatel, France
fYear
1993
fDate
17-20 Oct 1993
Firstpage
574
Lastpage
579
Abstract
It is shown that a critical space charge variation is the cause of insulator sample damage ranging from atom size to macroscopic size. This finding has implications for space charge characterization. Correlation of the space charge characteristics to breakdown strength requires the critical conditions for initiating breakdown. These conditions are related to such material intrinsic parameters as the trap energy distribution, the trap spatial distribution, the schubweg, and the modification of the free energy of the charged sample. The crucial point is therefore not how to measure the charge distribution but how to characterize trapping/detrapping critical parameters
Keywords
electric breakdown; electron traps; free energy; space charge; atom size; breakdown strength; charge detrapping; critical space charge variation; free energy; insulator sample damage; macroscopic size; material intrinsic parameters; schubweg; space charge characterization; trap energy distribution; trap spatial distribution; Corona; Electric breakdown; Electron beams; Electron traps; Electrostatic discharge; Insulation; Mechanical energy; Plasma temperature; Space charge; Surface discharges;
fLanguage
English
Publisher
ieee
Conference_Titel
Electrical Insulation and Dielectric Phenomena, 1993. Annual Report., Conference on
Conference_Location
Pocono Manor, PA
Print_ISBN
0-7803-0966-9
Type
conf
DOI
10.1109/CEIDP.1993.378911
Filename
378911
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