Title :
An on-line soft error mitigation technique for control logic of VLIW processors
Author :
Rohani, Alireza ; Kerkhoff, Hans G.
Author_Institution :
Testable Design & Test of Integrated Syst. Group CUT, Univ. of Twente, Enschede, Netherlands
Abstract :
The soft error phenomenon is forecast to be a real threat for today´s technology of ICs. While implementing error detection and correction codes for regular structural memory arrays have been effectively used to stem the emerging soft error threat, utilizing a low overhead approach for the complex and unstructured control logic of modern processors is still a challenge. This paper presents a low overhead reliability enhancement scheme for the control logic of a Very Large Instruction Word (VLIW) processor. First, a soft error sensitivity analysis has been carried out in order to distinguish the most vulnerable signals inside the control unit. Subsequently, these vulnerable control signals have been classified into either an opcode-dependent or instruction-dependent control signal. The strategy for protecting opcode-dependent control signals utilizes a ROM memory, while instruction-dependent control signals are protected using a RAM memory as a cache to store a history of these control signals along with the Triple Modular Redundancy concept to mask the single transient faults. This technique has been implemented on a high-performance processor, the Xentium processor, in order to validate its degree of fault tolerance and performance overhead as well.
Keywords :
error correction codes; error detection codes; fault tolerance; integrated circuit reliability; multiprocessing systems; radiation hardening (electronics); random-access storage; read-only storage; sensitivity analysis; IC; RAM memory; ROM memory; VLIW processors; Xentium processor; error correction codes; error detection codes; fault tolerance; instruction-dependent control signal; low overhead reliability enhancement scheme; online soft error mitigation technique; opcode-dependent control signal; performance overhead; regular structural memory arrays; single transient faults; soft error sensitivity analysis; triple modular redundancy concept; unstructured control logic; very large instruction word processor; vulnerable control signals; Decision support systems; Discrete Fourier transforms; Fault tolerance; Fault tolerant systems; Nanotechnology; Very large scale integration; DSP processor; simulation-based fault injection; single event transient; soft-errors;
Conference_Titel :
Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT), 2012 IEEE International Symposium on
Conference_Location :
Austin, TX
Print_ISBN :
978-1-4673-3043-5
DOI :
10.1109/DFT.2012.6378205