Title :
Reliable Fault-Tolerant Multipath routing protocol for wireless sensor networks
Author :
Alwan, Hind ; Agarwal, Anjali
Author_Institution :
Dept. of Electr. & Comput. Eng., Concordia Univ., Montreal, QC, Canada
Abstract :
Several routing protocols have been designed in the recent years to support different wireless sensor networks requirements. In this paper, we introduce a new on demand routing protocol, Reliable Fault-Tolerant Multipath (RFTM), to improve the reliability of data routing in wireless sensor networks. RFTM is a multi objective routing protocol that meets diverse application requirements by considering the changing conditions of the network. The protocol takes into account both reliability demand and link quality to determine the number of desired multiple disjoint paths between the sink and source nodes. With the advantage of data splitting method based on erasure coding the packets are encoded at source nodes and the sink node obtains the data by decoding. Moreover, the sink node can make intelligent decisions based on the node´s available resources, hop count to the source and delay to lengthen the network lifetime, provides fault-tolerance and achieves the desired reliability that meets the network state and the different application requirements.
Keywords :
routing protocols; telecommunication network reliability; wireless sensor networks; RFTM protocol; data routing reliability; data splitting method; erasure coding; fault tolerance; multiobjective routing protocol; network lifetime; reliable fault-tolerant multipath routing protocol; sink nodes; source nodes; wireless sensor networks; Computer network reliability; Data communication; Decoding; Fault tolerance; Quality of service; Routing protocols; Sensor phenomena and characterization; Telecommunication network reliability; Telecommunication traffic; Wireless sensor networks; fault-tolerance; link quality; multi disjoint paths; reliability; wireless sensor networks;
Conference_Titel :
Communications (QBSC), 2010 25th Biennial Symposium on
Conference_Location :
Kingston, ON
Print_ISBN :
978-1-4244-5709-0
DOI :
10.1109/BSC.2010.5472947