Title :
Amalgamated q-ary codes for multi-level flash memories
Author :
Manzor, Yifat ; Keren, Osnat
Abstract :
A flash memory is a non-volatile memory based on electron storing mechanism. A multi-level flash memory cell can store one of q symbols (q >; 2). As q increases, the data becomes less reliable and the probability it may be distorted by different types of errors increases. This paper presents an amalgamated q-ary code capable of correcting a mixture of ts symmetric errors and additional ta asymmetric errors of limited magnitude l. In the proposed code, each q-ary codeword is composed of n multi-bit symbols, each multi-bit (i.e. q-ary) symbol is viewed as two sub-symbols over two different alphabets. The new construction has higher code rate than the conventional single-alphabet code.
Keywords :
flash memories; amalgamated q-ary codes; electron storing mechanism; multibit symbol; multilevel flash memory cell; nonvolatile memory; single-alphabet code; symmetric errors; Ash; Decoding; Encoding; Error probability; Redundancy; Strips; Vectors;
Conference_Titel :
Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT), 2012 IEEE International Symposium on
Conference_Location :
Austin, TX
Print_ISBN :
978-1-4673-3043-5
DOI :
10.1109/DFT.2012.6378207