Title :
Accurate calculation of SET propagation probability for hardening
Author :
Gangadhar, Sreenivas ; Tragoudas, Spyros
Author_Institution :
Dept. of Electr. & Comput. Eng., Southern Illinois Univ. Carbondale, Carbondale, IL, USA
Abstract :
A novel method is proposed to enhance SET propagation probability and it is shown how it can assist the hardening process. This paper provides a method to determine a set of patterns that must be applied at the inputs to determine propagation characteristics of the SET that are meaningful for hardening purposes. The impact of the proposed method is experimentally verified on the ISCAS and ITC benchmarks.
Keywords :
probability; radiation hardening (electronics); sequential circuits; ISCAS benchmarks; ITC benchmarks; SET propagation characteristics; SET propagation probability; radiation hardening process; sequential circuit; soft error hardening techniques; Boolean functions; Circuit faults; Delay; Integrated circuit modeling; Logic gates; Probability; Sequential circuits;
Conference_Titel :
Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT), 2012 IEEE International Symposium on
Conference_Location :
Austin, TX
Print_ISBN :
978-1-4673-3043-5
DOI :
10.1109/DFT.2012.6378208
