Title :
Manufacturability of VCSEL components and VCSEL products
Author :
Tatum, Jim A. ; Guenter, James K. ; Johnson, Ralph H.
Author_Institution :
Microswitch Div., Honeywell, Richardson, TX, USA
Abstract :
In this paper, we examine several of the properties of VCSELs that enhance their manufacturability, and we describe how those characteristics may be exploited in the manufacturing environment. The ability to test the lasers while still in wafer form, the enhanced reliability, and the ability to package the laser in traditional LED package styles are among the most significant points enabling high-volume VCSEL manufacture
Keywords :
optical fabrication; surface emitting lasers; VCSEL component; VCSEL product; high-volume production; manufacturability; packaging; reliability; testing; vertical cavity surface emitting laser; Costs; Light emitting diodes; Manufacturing; Packaging machines; Semiconductor device manufacture; Semiconductor lasers; Surface emitting lasers; Testing; Threshold current; Vertical cavity surface emitting lasers;
Conference_Titel :
Lasers and Electro-Optics Society Annual Meeting, 1998. LEOS '98. IEEE
Conference_Location :
Orlando, FL
Print_ISBN :
0-7803-4947-4
DOI :
10.1109/LEOS.1998.739787
