Title :
Transient pulse propagation using the Weibull distribution function
Author :
Watkins, A. ; Tragoudas, Spyros
Author_Institution :
Dept. of Electr. & Comput. Eng., Southern Illinois Univ. Carbondale, Carbondale, IL, USA
Abstract :
The proposed deterministic model aims to improve Soft Error Rate estimation by accurately approximating the generated pulse and all subsequent pulses. The generated pulse is approximated by a piecewise function consisting of two Weibull cumulative distribution functions. This method is an improvement over existing methods as it offers high accuracy while requiring less pre-characterization. This is accomplished by fitting a pulse to the Weibull function using actual gate parameters.
Keywords :
Weibull distribution; deterministic algorithms; pulse circuits; radiation hardening (electronics); Weibull cumulative distribution functions; actual gate parameters; deterministic model; generated pulse; piecewise function; soft error rate estimation improvement; transient pulse propagation; Decision support systems; Discrete Fourier transforms; Fault tolerance; Fault tolerant systems; Nanotechnology; Very large scale integration;
Conference_Titel :
Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT), 2012 IEEE International Symposium on
Conference_Location :
Austin, TX
Print_ISBN :
978-1-4673-3043-5
DOI :
10.1109/DFT.2012.6378209
