DocumentCode
2475233
Title
Iterative Learning Control using a basis signal library
Author
Hoelzle, David J. ; Alleyne, Andrew G. ; Johnson, Amy J Wagoner
Author_Institution
Mech. Sci. & Eng. Dept., Univ. of Illinois at Urbana-Champaign, Urbana, IL, USA
fYear
2009
fDate
10-12 June 2009
Firstpage
925
Lastpage
930
Abstract
There are a vast number of manufacturing applications that are repetitive in nature and therefore can benefit from iterative learning control (ILC) algorithms. However, some of these applications are unfit for continuous open loop signal updates from ILC either because the complete manufacturing cycle includes abrupt transitions in system dynamics or is prohibitively long for efficient implementation. This paper explores a method to control one such system, micro robotic deposition (muRD), using ILC as an open loop control signal identification technique. Instead of continuously updating the ILC control signal for the complete operation, we exploit the characteristic that all muRD cycles are a sequence of a few basis tasks and only these basis tasks are learned. Control signals for these basis tasks build a library of basis signals, which can then be appropriately sequenced as the control signal for the complete manufacturing cycle. This paper introduces a method to build this basis signal library and extract and coordinate the signals depending on predefined muRD operations and material used as specified by numerically controlled machine language. The methods applied to muRD display the ability to drastically improve end product quality with a significantly shortened signal identification process.
Keywords
iterative methods; learning (artificial intelligence); microrobots; open loop systems; basis signal library; continuous open loop signal updates; iterative learning control; manufacturing applications; microrobotic deposition; numerically controlled machine language; open loop control signal identification technique; product quality; signal identification process; system dynamics; Control systems; Ink; Iterative algorithms; Libraries; Manufacturing; Open loop systems; Polymers; Signal processing; Trajectory; USA Councils;
fLanguage
English
Publisher
ieee
Conference_Titel
American Control Conference, 2009. ACC '09.
Conference_Location
St. Louis, MO
ISSN
0743-1619
Print_ISBN
978-1-4244-4523-3
Electronic_ISBN
0743-1619
Type
conf
DOI
10.1109/ACC.2009.5160565
Filename
5160565
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