DocumentCode
2475276
Title
PD-related stresses in the bulk dielectric and their evaluation
Author
Pedersen, A. ; Crichton, G.C. ; McAllister, I.W.
Author_Institution
Tech. Univ. of Denmark, Lyngby, Denmark
fYear
1993
fDate
17-20 Oct 1993
Firstpage
474
Lastpage
480
Abstract
The application of electromagnetic field theory to the subject of partial discharges shows that discharging in a void generates large field distortions within the bulk dielectric in the proximity of the void. Such inherent over-stressing of a dielectric could be the effect which triggers the onset of electrical treeing and other damaging processes, and which subsequently precipitates the breakdown of the insulation. If there were a train of partial discharge events per power frequency cycle, then, during each half period, these events would lead to cumulative stress levels within the solid dielectric
Keywords
electric breakdown; electromagnetic field theory; internal stresses; partial discharges; trees (electrical); voids (solid); PD-related stresses; breakdown; bulk dielectric; cumulative stress levels; discharging; electrical treeing; electromagnetic field theory; insulation; large field distortions; partial discharges; void; Dielectrics; Disk recording; Electrodes; Electrostatic induction; Partial discharges; Physics; Power engineering and energy; Shape measurement; Stress; Surface discharges;
fLanguage
English
Publisher
ieee
Conference_Titel
Electrical Insulation and Dielectric Phenomena, 1993. Annual Report., Conference on
Conference_Location
Pocono Manor, PA
Print_ISBN
0-7803-0966-9
Type
conf
DOI
10.1109/CEIDP.1993.378927
Filename
378927
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