• DocumentCode
    2475276
  • Title

    PD-related stresses in the bulk dielectric and their evaluation

  • Author

    Pedersen, A. ; Crichton, G.C. ; McAllister, I.W.

  • Author_Institution
    Tech. Univ. of Denmark, Lyngby, Denmark
  • fYear
    1993
  • fDate
    17-20 Oct 1993
  • Firstpage
    474
  • Lastpage
    480
  • Abstract
    The application of electromagnetic field theory to the subject of partial discharges shows that discharging in a void generates large field distortions within the bulk dielectric in the proximity of the void. Such inherent over-stressing of a dielectric could be the effect which triggers the onset of electrical treeing and other damaging processes, and which subsequently precipitates the breakdown of the insulation. If there were a train of partial discharge events per power frequency cycle, then, during each half period, these events would lead to cumulative stress levels within the solid dielectric
  • Keywords
    electric breakdown; electromagnetic field theory; internal stresses; partial discharges; trees (electrical); voids (solid); PD-related stresses; breakdown; bulk dielectric; cumulative stress levels; discharging; electrical treeing; electromagnetic field theory; insulation; large field distortions; partial discharges; void; Dielectrics; Disk recording; Electrodes; Electrostatic induction; Partial discharges; Physics; Power engineering and energy; Shape measurement; Stress; Surface discharges;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electrical Insulation and Dielectric Phenomena, 1993. Annual Report., Conference on
  • Conference_Location
    Pocono Manor, PA
  • Print_ISBN
    0-7803-0966-9
  • Type

    conf

  • DOI
    10.1109/CEIDP.1993.378927
  • Filename
    378927