Title :
High-sensitive measurement of surface charge distribution using spatial light phase modulator and image locking amplifier
Author :
Suzuki, S. ; Takayama, M. ; Hirata, Y. ; Kawasaki, T. ; Takada, T. ; Maeno, T.
Author_Institution :
Musashi Inst. of Technol., Tokyo, Japan
Abstract :
By application of the electrooptic Pockels effect of the BSO (Bi 12SiO20) crystal, a measurement method for measuring the electrical surface charge distribution on an insulating film was developed. Using an image lock-in amplifier and a spatial optical phase modulator, the measurement system was improved with respect to sensitivity and resolution. With this improvement, the amount, polarity, and pattern of surface charges produced by an impulse surface discharge on insulating materials can be observed very clearly. The spatial resolution is enhanced from 750 μm to 200 μm, and the sensitivity is also enhanced. The typical surface charge distribution of a positive streamer generated by a high-voltage impulse (5 kV peak) is presented
Keywords :
Pockels effect; bismuth compounds; charge measurement; insulating thin films; surface charging; surface discharges; 200 micron; 5 kV; BSO; Bi12SiO20; electrooptic Pockels effect; high-voltage impulse; image lock-in amplifier; image locking amplifier; impulse surface discharge; insulating film; positive streamer; resolution; sensitivity; spatial light phase modulator; spatial optical phase modulator; spatial resolution; surface charge distribution; surface charges; Bismuth; Charge measurement; Current measurement; Dielectrics and electrical insulation; Electric variables measurement; Optical amplifiers; Optical films; Semiconductor optical amplifiers; Spatial resolution; Surface discharges;
Conference_Titel :
Electrical Insulation and Dielectric Phenomena, 1993. Annual Report., Conference on
Conference_Location :
Pocono Manor, PA
Print_ISBN :
0-7803-0966-9
DOI :
10.1109/CEIDP.1993.378931
