DocumentCode :
2475401
Title :
Numerical two dimensional modeling of silicon solar cells with experiment validation
Author :
Rapolu, Kalyan ; Singh, Pritpal ; Shea, Stephen P. ; Meier, Daniel L.
Author_Institution :
Dept. of Electr. & Comput. Eng., Villanova Univ., Villanova, PA, USA
fYear :
2010
fDate :
6-9 Sept. 2010
Firstpage :
75
Lastpage :
76
Abstract :
A two dimensional numerical model for silicon solar cells has been developed in COMSOL. This model calculates the influence of emitter doping profile, sheet resistance, and recombination on the performance of the solar cell in two dimensions. The solar cell model has an n+ p p+ structure with a measured doping profile in the emitter and uniformly doped back surface field. The surface recombination velocity at the front surface is calculated based on the surface doping density. The carrier flow pattern in the solar cell was analyzed by solving the diffusion equations using appropriate boundary conditions. The numerical model was developed in COMSOL by solving the Poisson equation, the current density equation and the continuity equation in each region. An important design parameter of conventional Si solar cells is the emitter region and determining its influence on front contact spacing. This model can also be used for optimizing the front contact design. The model uses finite element analysis for these calculations. Solar cells have been fabricated with various emitter doping profiles and are characterized. Experimental I-V characteristics and IQE response values are compared with simulation results.
Keywords :
Poisson equation; carrier mobility; contact resistance; current density; doping profiles; electrical contacts; elemental semiconductors; finite element analysis; semiconductor doping; silicon; solar cells; surface diffusion; surface recombination; COMSOL; I-V characteristics; IQE response values; Poisson equation; Si; boundary conditions; carrier flow pattern; continuity equation; conventional silicon solar cells; current density equation; design parameter; diffusion equations; emitter doping profile; emitter region; finite element analysis; front contact design; front contact spacing; front surface; numerical 2D modeling; sheet resistance; solar cell model; surface doping density; surface recombination velocity; uniformly doped back surface field; Doping profiles; Mathematical model; Numerical models; Photovoltaic cells; Semiconductor device measurement; Semiconductor process modeling; Silicon;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Numerical Simulation of Optoelectronic Devices (NUSOD), 2010 10th International Conference on
Conference_Location :
Atlanta, GA
ISSN :
2158-3234
Print_ISBN :
978-1-4244-7016-7
Electronic_ISBN :
2158-3234
Type :
conf
DOI :
10.1109/NUSOD.2010.5595660
Filename :
5595660
Link To Document :
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