DocumentCode
2475417
Title
Trap states limited nanosecond response of organic solar cells
Author
Christ, Nico ; Kettlitz, Siegfried W. ; Züfle, Simon ; Valouch, Sebastian ; Lemmer, Uli
Author_Institution
Light Technol. Inst. (LTI), Karlsruhe Inst. of Technol. (KIT), Karlsruhe, Germany
fYear
2010
fDate
6-9 Sept. 2010
Firstpage
69
Lastpage
70
Abstract
Measured transient current voltage characteristics of organic solar cells exhibit a tail in the decline characteristic which is proportional to t-α. Common numerical drift-diffusion simulations neglecting dispersive charge carrier transport fail to describe the observed long tail of the current density decline up to micro seconds. Our approach is to account for the observed dispersive charge carrier transport by introducing an exponential distribution of trap states into our simulation. These trap states represent the tail of a bimodal distribution of energy states, which is commonly used to describe the distribution of transport sites of the highest occupied / lowest unoccupied molecular orbital (HOMO/LUMO) in organic materials. By doing so, we can reproduce the measured characteristics over four decades in time. Results are qualitatively and quantitatively in excellent accordance for different laser intensities, different applied biases and different device diameters at the same time.
Keywords
diffusion; numerical analysis; organic compounds; solar cells; bimodal distribution; charge carrier transport; current density; dispersive charge carrier transport; energy states; numerical drift-diffusion simulation; organic solar cells; transient current-voltage characteristics; trap states; Current density; Electron traps; Numerical models; Photovoltaic cells; Organic solar cell; P3HT:PCBM blend; nanosecond photoresponse; numerical simulation; optical modeling; organic photodetector; trap distribution;
fLanguage
English
Publisher
ieee
Conference_Titel
Numerical Simulation of Optoelectronic Devices (NUSOD), 2010 10th International Conference on
Conference_Location
Atlanta, GA
ISSN
2158-3234
Print_ISBN
978-1-4244-7016-7
Electronic_ISBN
2158-3234
Type
conf
DOI
10.1109/NUSOD.2010.5595661
Filename
5595661
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