• DocumentCode
    2475417
  • Title

    Trap states limited nanosecond response of organic solar cells

  • Author

    Christ, Nico ; Kettlitz, Siegfried W. ; Züfle, Simon ; Valouch, Sebastian ; Lemmer, Uli

  • Author_Institution
    Light Technol. Inst. (LTI), Karlsruhe Inst. of Technol. (KIT), Karlsruhe, Germany
  • fYear
    2010
  • fDate
    6-9 Sept. 2010
  • Firstpage
    69
  • Lastpage
    70
  • Abstract
    Measured transient current voltage characteristics of organic solar cells exhibit a tail in the decline characteristic which is proportional to t. Common numerical drift-diffusion simulations neglecting dispersive charge carrier transport fail to describe the observed long tail of the current density decline up to micro seconds. Our approach is to account for the observed dispersive charge carrier transport by introducing an exponential distribution of trap states into our simulation. These trap states represent the tail of a bimodal distribution of energy states, which is commonly used to describe the distribution of transport sites of the highest occupied / lowest unoccupied molecular orbital (HOMO/LUMO) in organic materials. By doing so, we can reproduce the measured characteristics over four decades in time. Results are qualitatively and quantitatively in excellent accordance for different laser intensities, different applied biases and different device diameters at the same time.
  • Keywords
    diffusion; numerical analysis; organic compounds; solar cells; bimodal distribution; charge carrier transport; current density; dispersive charge carrier transport; energy states; numerical drift-diffusion simulation; organic solar cells; transient current-voltage characteristics; trap states; Current density; Electron traps; Numerical models; Photovoltaic cells; Organic solar cell; P3HT:PCBM blend; nanosecond photoresponse; numerical simulation; optical modeling; organic photodetector; trap distribution;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Numerical Simulation of Optoelectronic Devices (NUSOD), 2010 10th International Conference on
  • Conference_Location
    Atlanta, GA
  • ISSN
    2158-3234
  • Print_ISBN
    978-1-4244-7016-7
  • Electronic_ISBN
    2158-3234
  • Type

    conf

  • DOI
    10.1109/NUSOD.2010.5595661
  • Filename
    5595661