DocumentCode :
2475520
Title :
Application of combined support vector machines in process fault diagnosis
Author :
Tafazzoli, Esmaeil ; Saif, Mehrdad
Author_Institution :
Sch. of Eng. Sci., Simon Fraser Univ., Vancouver, BC, Canada
fYear :
2009
fDate :
10-12 June 2009
Firstpage :
3429
Lastpage :
3433
Abstract :
The performance of Combined Support Vector Machines, C-SVM, is examined by comparing it´s classification results with k-nearest neighbor and simple SVM classifier. For our experiments we use training and testing data obtained from two benchmark industrial processes. The first set is simulated data generated from Tennessee Eastman process simulator and the second set is the data obtained by running experiment on a Three Tank system. Our results show that the C-SVM classifier gives the lowest classification error compared to other methods. However, the complexity and computation time become issues, which depend on the number of faults in the data and the data dimension. We also examined Principal Component Analysis, using PC scores as input features for the classifiers but the performance was not comparable to other classifiers´ results. By selecting appropriate number of variables using contribution charts for classification, the performance of the classifiers on Tennessee Eastman data enhances significantly. Therefore, using contribution charts for selecting the most important variables is necessary when the number of variables is large.
Keywords :
computational complexity; data reduction; fault diagnosis; pattern classification; principal component analysis; support vector machines; Tennessee Eastman process; computational complexity; data dimension; principal component analysis; process fault diagnosis; support vector machine; three tank system; Computational modeling; Fault detection; Fault diagnosis; Independent component analysis; Industrial training; Machine learning; Machine learning algorithms; Principal component analysis; Support vector machine classification; Support vector machines;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
American Control Conference, 2009. ACC '09.
Conference_Location :
St. Louis, MO
ISSN :
0743-1619
Print_ISBN :
978-1-4244-4523-3
Electronic_ISBN :
0743-1619
Type :
conf
DOI :
10.1109/ACC.2009.5160577
Filename :
5160577
Link To Document :
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