Title :
Determination of wave noise sources using spectral parametric modeling
Author :
Werling, T. ; Bourdel, E. ; Pasquet, D. ; Boudiaf, A.
Author_Institution :
ENSEA-EMO, Cergy, France
Abstract :
We measure transistor noise power density and compute the Fourier´s transform. Finally, spectral parametric modeling is used to extract noise waves correlation matrix. Results obtained by this new method has been experimentally compared with a conventional method.
Keywords :
Fourier transforms; correlation methods; electric noise measurement; semiconductor device noise; spectral analysis; transistors; Fourier transform; correlation matrix; spectral parametric model; transistor noise power density measurement; wave noise source; Autocorrelation; Circuit noise; Circuit testing; Density measurement; Fourier transforms; Noise measurement; Parametric statistics; Power amplifiers; Power measurement; Scattering parameters;
Conference_Titel :
Microwave Symposium Digest, 1997., IEEE MTT-S International
Conference_Location :
Denver, CO, USA
Print_ISBN :
0-7803-3814-6
DOI :
10.1109/MWSYM.1997.596602
