DocumentCode :
2475629
Title :
Multiscale modeling of atomic layer deposition processes
Author :
Dwivedi, Vivek ; Adomaitis, Raymond A.
Author_Institution :
Dept. of Chem. & Biomol. Eng., Univ. of Maryland, College Park, MD, USA
fYear :
2009
fDate :
10-12 June 2009
Firstpage :
2495
Lastpage :
2500
Abstract :
A multiscale simulator for alumina film growth inside a nanoporous material during an atomic layer deposition process is developed. The model combines a continuum description at the macroscopic level of precursor gas transport inside a nanopore during exposure to each of the two precursor species (trimethyaluminum and water) with a Monte Carlo simulation of the film growth on the microscopic scale. Simulation results are presented for both the Monte Carlo simulation and for the multiscale system, the latter illustrating how nonuniform deposition along the nanopore can occur when insufficient precursor exposure levels are used.
Keywords :
Monte Carlo methods; alumina; atomic layer deposition; dielectric thin films; nanoporous materials; Al2O3; Monte Carlo simulation; alumina film growth; atomic layer deposition; multiscale modeling; nanoporous material; nonuniform deposition; precursor gas transport; Amorphous materials; Atomic layer deposition; Chemical engineering; Educational institutions; Gases; Manufacturing; Microscopy; Nanoporous materials; Sputtering; Thickness control;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
American Control Conference, 2009. ACC '09.
Conference_Location :
St. Louis, MO
ISSN :
0743-1619
Print_ISBN :
978-1-4244-4523-3
Electronic_ISBN :
0743-1619
Type :
conf
DOI :
10.1109/ACC.2009.5160582
Filename :
5160582
Link To Document :
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