• DocumentCode
    2475629
  • Title

    Multiscale modeling of atomic layer deposition processes

  • Author

    Dwivedi, Vivek ; Adomaitis, Raymond A.

  • Author_Institution
    Dept. of Chem. & Biomol. Eng., Univ. of Maryland, College Park, MD, USA
  • fYear
    2009
  • fDate
    10-12 June 2009
  • Firstpage
    2495
  • Lastpage
    2500
  • Abstract
    A multiscale simulator for alumina film growth inside a nanoporous material during an atomic layer deposition process is developed. The model combines a continuum description at the macroscopic level of precursor gas transport inside a nanopore during exposure to each of the two precursor species (trimethyaluminum and water) with a Monte Carlo simulation of the film growth on the microscopic scale. Simulation results are presented for both the Monte Carlo simulation and for the multiscale system, the latter illustrating how nonuniform deposition along the nanopore can occur when insufficient precursor exposure levels are used.
  • Keywords
    Monte Carlo methods; alumina; atomic layer deposition; dielectric thin films; nanoporous materials; Al2O3; Monte Carlo simulation; alumina film growth; atomic layer deposition; multiscale modeling; nanoporous material; nonuniform deposition; precursor gas transport; Amorphous materials; Atomic layer deposition; Chemical engineering; Educational institutions; Gases; Manufacturing; Microscopy; Nanoporous materials; Sputtering; Thickness control;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    American Control Conference, 2009. ACC '09.
  • Conference_Location
    St. Louis, MO
  • ISSN
    0743-1619
  • Print_ISBN
    978-1-4244-4523-3
  • Electronic_ISBN
    0743-1619
  • Type

    conf

  • DOI
    10.1109/ACC.2009.5160582
  • Filename
    5160582