• DocumentCode
    2475661
  • Title

    Using the Berlekamp-Massey algorithm to obtain LFSR characteristic polynomials for TPG

  • Author

    Acevedo, Oscar ; Kagaris, Dimitri

  • Author_Institution
    ECE Dept., Southern Illinois Univ., Carbondale, IL, USA
  • fYear
    2012
  • fDate
    3-5 Oct. 2012
  • Firstpage
    233
  • Lastpage
    238
  • Abstract
    In built-in test pattern generation, a test cube is usually encoded or compressed by a seed vector that is used as the initial state of a Linear Feedback Shift Register (LFSR). The seed vector is found by solving a linear system of equations using a fixed (but arbitrarily chosen) characteristic polynomial for the LFSR In contrast, finding the LFSR characteristic polynomial to generate a given test cube provides more design freedom but results in a non-linear system of equations. In this paper, we address the latter problem using the Berlekamp-Massey (BM) algorithm. The BM algorithm is very efficient and obviates the need of solving a non-linear system, but it cannot work with don´t care values. We present therefore a procedure that assigns the don´t cares in a given test cube in such a way so as to minimize the resulting polynomial found by BM. Experimental results demonstrate the substantial improvement over a previous technique that assigns the don´t cares greedily.
  • Keywords
    automatic test pattern generation; built-in self test; logic testing; polynomials; shift registers; BM algorithm; Berlekamp-Massey algorithm; LFSR characteristic polynomials; TPG; built-in test pattern generation; fixed characteristic polynomial; linear equation system; linear feedback shift register; nonlinear equation system; seed vector; test cube; Decision support systems; Discrete Fourier transforms; Fault tolerance; Fault tolerant systems; Nanotechnology; Tin; Very large scale integration;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT), 2012 IEEE International Symposium on
  • Conference_Location
    Austin, TX
  • Print_ISBN
    978-1-4673-3043-5
  • Type

    conf

  • DOI
    10.1109/DFT.2012.6378229
  • Filename
    6378229