DocumentCode :
2475662
Title :
Metric Learning: A general dimension reduction framework for classification and visualization
Author :
Lu, Chunyuan ; Feng, Guocan ; Jiang, Jianmin ; Wang, Patrick
Author_Institution :
Sch. of Math. & Comput. Sci., Sun Yat-Sen Univ., China
fYear :
2008
fDate :
8-11 Dec. 2008
Firstpage :
1
Lastpage :
4
Abstract :
A new general dimension reduction framework based on similar and dissimilar metric learning is proposed in this paper which allows us to exploit the geometry of data to reduce the data dimension for classification and visualization. The general formulation can unify the existing dimension reduction algorithms within a common framework. Furthermore, this metric learning framework can be used as a general platform for developing new dimension reduction algorithms. By utilizing this framework as a tool, we propose a novel supervised dimension reduction algorithm named sub-manifold preserving analysis (SMPA) in which the intrinsic sub-manifold structure will be preserved while the margin of interclass will be separated. Experimental evidences show that performance of our proposed SMPA algorithm is better than other algorithms.
Keywords :
data reduction; data visualisation; geometry; learning (artificial intelligence); pattern classification; data classification; data reduction; data visualization; dissimilar metric learning; geometry; similar metric learning; sub-manifold preserving analysis; supervised dimension reduction framework; Algorithm design and analysis; Data visualization; Embedded computing; Laplace equations; Linear discriminant analysis; Machine learning algorithms; Mathematics; Principal component analysis; Sun; Symmetric matrices;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Pattern Recognition, 2008. ICPR 2008. 19th International Conference on
Conference_Location :
Tampa, FL
ISSN :
1051-4651
Print_ISBN :
978-1-4244-2174-9
Electronic_ISBN :
1051-4651
Type :
conf
DOI :
10.1109/ICPR.2008.4761130
Filename :
4761130
Link To Document :
بازگشت