Title :
Maintaining proximity to functional operation conditions under enhanced-scan tests based on functional broadside tests
Author_Institution :
Sch. of Electr. & Comput. Eng., Purdue Univ., West Lafayette, IN, USA
Abstract :
In a circuit with enhanced-scan, any two-pattern test can be applied to detect delay faults. However, the tests may deviate substantially from functional operation conditions, and result in overtesting. Functional broadside tests create functional operation conditions during their functional clock cycles by using reachable states as scan-in states. To maintain a proximity to functional operation conditions under enhanced-scan, the procedure described in this paper generates enhanced-scan tests that differ from functional broadside tests only in small numbers of values. Experimental results show that it is possible to achieve high transition fault coverage under this constraint.
Keywords :
semiconductor device testing; enhanced-scan tests; functional broadside tests; functional clock cycles; functional operation conditions; high transition fault coverage; proximity; scan-in states; two-pattern test; Circuit faults; Clocks; Delay; Fault tolerance; Fault tolerant systems; Switches; Vectors; Enhanced-scan; functional broadside tests; reachable states; transition faults;
Conference_Titel :
Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT), 2012 IEEE International Symposium on
Conference_Location :
Austin, TX
Print_ISBN :
978-1-4673-3043-5
DOI :
10.1109/DFT.2012.6378230
