Title : 
A system designed for black-spot´s automatic identification
         
        
            Author : 
Feng, Li-gui ; Bin, Chen-wen
         
        
            Author_Institution : 
Sch. of Optoelectron. Inf., Univ. of Electron. Sci. & Technol. of China, Chengdu, China
         
        
        
        
        
        
            Abstract : 
An automatic identification system for the OLED´s black-spot detection was designed in this paper. Complete approaches based on machine vision technology are proposed to get the sub-pixel location of black-spots. In this method, feature area is recognized based on the identification of spots´ edge characteristics. The method of circle fitting is used to get positions of the spots´ center. The experiments show that this system can realize the automatic identification for black spot´s feature and center in sub-pixel. The accuracy of algorithm is better, and its self-adaptability is high. It provides an necessary condition for further research of OLED defect detection.
         
        
            Keywords : 
computer vision; feature extraction; organic light emitting diodes; OLED; automatic identification svstem; black-spot detection; circle fitting method; machine vision technology; spot edge characteristic identification; sub-pixel location; Algorithm design and analysis; Fitting; Image edge detection; Noise; Organic light emitting diodes; Pixel; Shape; Automatic identification; Black-spots; OLED; Sub- pixel;
         
        
        
        
            Conference_Titel : 
Apperceiving Computing and Intelligence Analysis (ICACIA), 2010 International Conference on
         
        
            Conference_Location : 
Chengdu
         
        
            Print_ISBN : 
978-1-4244-8025-8
         
        
        
            DOI : 
10.1109/ICACIA.2010.5709947