Title :
Numerical analysis of steady-state and transient charge transport in organic semiconductor devices
Author :
Knapp, Evelyne ; Ruhstaller, Beat
Author_Institution :
Inst. of Comput. Phys., Zurich Univ. of Appl. Sci., Winterthur, Switzerland
Abstract :
A one-dimensional numerical model for the simulation of organic light-emitting devices (OLEDs) is presented. The model accounts for the disordered nature of organic semiconductors by a Gaussian density of states and the use of the Fermi-Dirac statistics. It includes density- and field-dependent mobilities and the generalized Einstein relation. The novel model ingredients perform well in combination with the numerical methods which solve the drift-diffusion problem. The results of three different measurement setups are reproduced by the use of different numerical techniques, i.e. we efficiently simulate current-voltage curves, dark-injection transients and impedance spectroscopy. This is crucial for model validation and parameter extraction. We compare the simulations with analytical solutions and measurements.
Keywords :
Gaussian distribution; electronic density of states; fermion systems; organic light emitting diodes; organic semiconductors; quantum statistical mechanics; 1D numerical model; Fermi-Dirac statistics; Gaussian density of states; current-voltage curves; dark-injection transients; density-dependent mobilities; disordered nature; drift-diffusion problem; field-dependent mobilities; generalized Einstein relation; impedance spectroscopy; model validation; organic light emitting devices simulation; organic semiconductor devices; parameter extraction; steady-state charge transport; transient charge transport; Charge carrier processes; Current measurement; Equations; Mathematical model; Numerical models; Organic light emitting diodes; Transient analysis;
Conference_Titel :
Numerical Simulation of Optoelectronic Devices (NUSOD), 2010 10th International Conference on
Conference_Location :
Atlanta, GA
Print_ISBN :
978-1-4244-7016-7
Electronic_ISBN :
2158-3234
DOI :
10.1109/NUSOD.2010.5595680