DocumentCode
2475956
Title
A Full-Band Monte Carlo study of gain, bandwidth and noise of GaN avalanche photodiodes
Author
Moresco, Michele ; Bertazzi, Francesco ; Bellotti, Enrico
Author_Institution
ECE Dept., Boston Univ., Boston, MA, USA
fYear
2010
fDate
6-9 Sept. 2010
Firstpage
27
Lastpage
28
Abstract
A growing number of system applications are increasingly demanding high speed, low noise, and high sensitivity UV detectors. GaN avalanche photodiodes (APDs) are prime candidates to become the device of choice in this area. This work presents a theoretical analysis of the performance of GaN APDs using Full Band Monte Carlo simulation. A study of the multiplication gain, noise and bandwidth is presented in this paper. The numerical results are in good agreement with experimental data available in literature.
Keywords
III-V semiconductors; Monte Carlo methods; avalanche photodiodes; gallium compounds; wide band gap semiconductors; GaN; avalanche photodiodes; full band Monte Carlo simulation; multiplication gain; Avalanche photodiodes; Bandwidth; Charge carrier processes; Gallium nitride; Impact ionization; Monte Carlo methods; Noise;
fLanguage
English
Publisher
ieee
Conference_Titel
Numerical Simulation of Optoelectronic Devices (NUSOD), 2010 10th International Conference on
Conference_Location
Atlanta, GA
ISSN
2158-3234
Print_ISBN
978-1-4244-7016-7
Electronic_ISBN
2158-3234
Type
conf
DOI
10.1109/NUSOD.2010.5595684
Filename
5595684
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