DocumentCode :
2475956
Title :
A Full-Band Monte Carlo study of gain, bandwidth and noise of GaN avalanche photodiodes
Author :
Moresco, Michele ; Bertazzi, Francesco ; Bellotti, Enrico
Author_Institution :
ECE Dept., Boston Univ., Boston, MA, USA
fYear :
2010
fDate :
6-9 Sept. 2010
Firstpage :
27
Lastpage :
28
Abstract :
A growing number of system applications are increasingly demanding high speed, low noise, and high sensitivity UV detectors. GaN avalanche photodiodes (APDs) are prime candidates to become the device of choice in this area. This work presents a theoretical analysis of the performance of GaN APDs using Full Band Monte Carlo simulation. A study of the multiplication gain, noise and bandwidth is presented in this paper. The numerical results are in good agreement with experimental data available in literature.
Keywords :
III-V semiconductors; Monte Carlo methods; avalanche photodiodes; gallium compounds; wide band gap semiconductors; GaN; avalanche photodiodes; full band Monte Carlo simulation; multiplication gain; Avalanche photodiodes; Bandwidth; Charge carrier processes; Gallium nitride; Impact ionization; Monte Carlo methods; Noise;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Numerical Simulation of Optoelectronic Devices (NUSOD), 2010 10th International Conference on
Conference_Location :
Atlanta, GA
ISSN :
2158-3234
Print_ISBN :
978-1-4244-7016-7
Electronic_ISBN :
2158-3234
Type :
conf
DOI :
10.1109/NUSOD.2010.5595684
Filename :
5595684
Link To Document :
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