• DocumentCode
    2476167
  • Title

    Study of the secondary electron emission of insulators by a Monte-Carlo simulation method

  • Author

    Ganachaud, J.-P. ; Mokrani, A.

  • Author_Institution
    Fac. des Sci. et des Tech., Nantes Univ., France
  • fYear
    1993
  • fDate
    17-20 Oct 1993
  • Firstpage
    233
  • Lastpage
    238
  • Abstract
    A Monte-Carlo simulation model has been constructed to describe the secondary electron emission of insulator targets. It accounts for the different electron insulator elementary processes. Other aspects relevant to recent developments in the field of space charge physics (distribution of polaron trapping sites, field distribution, etc.) are also included. The conclusions obtained by this method are in good agreement with experimental observations. The study suggests that a realistic simulation model, including elastic effects, the existence of defects and polaron trapping sites and the effect of the electrostatic field, is necessary in order to account for the measured values of the secondary yield in an insulator target like alumina
  • Keywords
    Monte Carlo methods; alumina; electrostatics; insulating materials; insulation; polarons; secondary electron emission; space charge; Al2O3; Monte-Carlo simulation method; alumina; defects; elastic effects; electron insulator elementary processes; electrostatic field; field distribution; insulators; polaron trapping sites; secondary electron emission; space charge physics; Acoustic scattering; Dielectrics; Electron emission; Electron traps; Insulation; Optical distortion; Optical scattering; Particle scattering; Phonons; Solid modeling;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electrical Insulation and Dielectric Phenomena, 1993. Annual Report., Conference on
  • Conference_Location
    Pocono Manor, PA
  • Print_ISBN
    0-7803-0966-9
  • Type

    conf

  • DOI
    10.1109/CEIDP.1993.378967
  • Filename
    378967