• DocumentCode
    2476217
  • Title

    Linking fabrication and parametric testing to VLSI design courses

  • Author

    Pearson, Robert

  • Author_Institution
    Dept. of Microelectron. Eng., Rochester Inst. of Technol., NY, USA
  • fYear
    1995
  • fDate
    16-18 Mar 1995
  • Firstpage
    246
  • Lastpage
    249
  • Abstract
    The actual versus simulated performance of VLSI systems is dependent on the accuracy of the simulation model parameters and the soundness of the design rules used. Future process engineers must be schooled in VLSI design principles, while at the same time understanding the origin of the process based design rules and the statistical variation of device model parameters. This paper describes RIT´s implementation of course work to meet these goals
  • Keywords
    VLSI; educational courses; electronic engineering education; integrated circuit design; integrated circuit modelling; integrated circuit testing; VLSI design courses; device models; parametric testing; simulation model parameters; Acoustical engineering; Circuits; Design engineering; Fabrication; Foundries; Joining processes; Process design; Software tools; Testing; Very large scale integration;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    VLSI, 1995. Proceedings., Fifth Great Lakes Symposium on
  • Conference_Location
    Buffalo, NY
  • ISSN
    1066-1395
  • Print_ISBN
    0-8186-7035-5
  • Type

    conf

  • DOI
    10.1109/GLSV.1995.516061
  • Filename
    516061