DocumentCode
2476217
Title
Linking fabrication and parametric testing to VLSI design courses
Author
Pearson, Robert
Author_Institution
Dept. of Microelectron. Eng., Rochester Inst. of Technol., NY, USA
fYear
1995
fDate
16-18 Mar 1995
Firstpage
246
Lastpage
249
Abstract
The actual versus simulated performance of VLSI systems is dependent on the accuracy of the simulation model parameters and the soundness of the design rules used. Future process engineers must be schooled in VLSI design principles, while at the same time understanding the origin of the process based design rules and the statistical variation of device model parameters. This paper describes RIT´s implementation of course work to meet these goals
Keywords
VLSI; educational courses; electronic engineering education; integrated circuit design; integrated circuit modelling; integrated circuit testing; VLSI design courses; device models; parametric testing; simulation model parameters; Acoustical engineering; Circuits; Design engineering; Fabrication; Foundries; Joining processes; Process design; Software tools; Testing; Very large scale integration;
fLanguage
English
Publisher
ieee
Conference_Titel
VLSI, 1995. Proceedings., Fifth Great Lakes Symposium on
Conference_Location
Buffalo, NY
ISSN
1066-1395
Print_ISBN
0-8186-7035-5
Type
conf
DOI
10.1109/GLSV.1995.516061
Filename
516061
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