Title :
Linking fabrication and parametric testing to VLSI design courses
Author_Institution :
Dept. of Microelectron. Eng., Rochester Inst. of Technol., NY, USA
Abstract :
The actual versus simulated performance of VLSI systems is dependent on the accuracy of the simulation model parameters and the soundness of the design rules used. Future process engineers must be schooled in VLSI design principles, while at the same time understanding the origin of the process based design rules and the statistical variation of device model parameters. This paper describes RIT´s implementation of course work to meet these goals
Keywords :
VLSI; educational courses; electronic engineering education; integrated circuit design; integrated circuit modelling; integrated circuit testing; VLSI design courses; device models; parametric testing; simulation model parameters; Acoustical engineering; Circuits; Design engineering; Fabrication; Foundries; Joining processes; Process design; Software tools; Testing; Very large scale integration;
Conference_Titel :
VLSI, 1995. Proceedings., Fifth Great Lakes Symposium on
Conference_Location :
Buffalo, NY
Print_ISBN :
0-8186-7035-5
DOI :
10.1109/GLSV.1995.516061