• DocumentCode
    2476395
  • Title

    Repetitive control with Prandtl-Ishlinskii hysteresis inverse for piezo-based nanopositioning

  • Author

    Shan, Yingfeng ; Leang, Kam K.

  • Author_Institution
    Mech. Eng. Dept., Univ. of Nevada-Reno, Reno, NV, USA
  • fYear
    2009
  • fDate
    10-12 June 2009
  • Firstpage
    301
  • Lastpage
    306
  • Abstract
    Repetitive control (RC) is a feedback-based approach useful for tracking periodic reference trajectories, for example in scanning applications. The major challenges with RC include closed-loop stability, robustness, and minimizing the steady-state tracking error. In piezo-based nanopositioning systems, the hysteresis effect can limit the performance of RC designed based on a linear dynamics model. An enhanced discrete-time repetitive controller is combined with an inverse-hysteresis compensator based on the Prandtl-Ishlinskii (P-I) model for hysteresis. The feasibility of the inverse model and the performance of the RC system with the inverse compensator are investigated experimentally. Measured results from a flexure-guided nano-positioner show that hysteresis compensation leads to improvement in the stability margin and rate of convergence of the tracking error for the closed-loop RC system. For scanning at 25 Hz, the maximum tracking error is 1.72%.
  • Keywords
    closed loop systems; compensation; control system synthesis; convergence; discrete time systems; error statistics; feedback; hysteresis; linear systems; nanopositioning; periodic control; piezoelectric actuators; robust control; tracking; Prandtl-Ishlinskii model; closed-loop stability; convergence; discrete-time repetitive controller design; feedback; inverse-hysteresis compensator; linear dynamics model; nanopositioning; periodic reference trajectory tracking; piezoactuator; robust control; scanning application; steady-state tracking error minimization; Atomic force microscopy; Control systems; Hysteresis; Inverse problems; Nanopositioning; Radio control; Robust stability; Scanning probe microscopy; Steady-state; Trajectory;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    American Control Conference, 2009. ACC '09.
  • Conference_Location
    St. Louis, MO
  • ISSN
    0743-1619
  • Print_ISBN
    978-1-4244-4523-3
  • Electronic_ISBN
    0743-1619
  • Type

    conf

  • DOI
    10.1109/ACC.2009.5160618
  • Filename
    5160618