DocumentCode :
2476395
Title :
Repetitive control with Prandtl-Ishlinskii hysteresis inverse for piezo-based nanopositioning
Author :
Shan, Yingfeng ; Leang, Kam K.
Author_Institution :
Mech. Eng. Dept., Univ. of Nevada-Reno, Reno, NV, USA
fYear :
2009
fDate :
10-12 June 2009
Firstpage :
301
Lastpage :
306
Abstract :
Repetitive control (RC) is a feedback-based approach useful for tracking periodic reference trajectories, for example in scanning applications. The major challenges with RC include closed-loop stability, robustness, and minimizing the steady-state tracking error. In piezo-based nanopositioning systems, the hysteresis effect can limit the performance of RC designed based on a linear dynamics model. An enhanced discrete-time repetitive controller is combined with an inverse-hysteresis compensator based on the Prandtl-Ishlinskii (P-I) model for hysteresis. The feasibility of the inverse model and the performance of the RC system with the inverse compensator are investigated experimentally. Measured results from a flexure-guided nano-positioner show that hysteresis compensation leads to improvement in the stability margin and rate of convergence of the tracking error for the closed-loop RC system. For scanning at 25 Hz, the maximum tracking error is 1.72%.
Keywords :
closed loop systems; compensation; control system synthesis; convergence; discrete time systems; error statistics; feedback; hysteresis; linear systems; nanopositioning; periodic control; piezoelectric actuators; robust control; tracking; Prandtl-Ishlinskii model; closed-loop stability; convergence; discrete-time repetitive controller design; feedback; inverse-hysteresis compensator; linear dynamics model; nanopositioning; periodic reference trajectory tracking; piezoactuator; robust control; scanning application; steady-state tracking error minimization; Atomic force microscopy; Control systems; Hysteresis; Inverse problems; Nanopositioning; Radio control; Robust stability; Scanning probe microscopy; Steady-state; Trajectory;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
American Control Conference, 2009. ACC '09.
Conference_Location :
St. Louis, MO
ISSN :
0743-1619
Print_ISBN :
978-1-4244-4523-3
Electronic_ISBN :
0743-1619
Type :
conf
DOI :
10.1109/ACC.2009.5160618
Filename :
5160618
Link To Document :
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