• DocumentCode
    2476488
  • Title

    An inspection strategy for randomly failing systems subjected to random shocks

  • Author

    Chelbi, Anis ; Ait-Kadi, Daoud

  • Author_Institution
    Dept. of Mech. Eng., Laval Univ., Que., Canada
  • Volume
    1
  • fYear
    1996
  • fDate
    5-10 Aug 1996
  • Firstpage
    614
  • Abstract
    This paper is motivated by the study of randomly failing systems whose state is only known through inspection and for which high availability is required. Security and alarm systems such as power system protective relays and environmental censoring equipment are typical examples of such systems. The deterioration process of these systems is generally governed by electromechanical transient shocks which occur randomly over time and whose magnitude is also random. These shocks damage the system cumulatively. Under the proposed inspection strategy, the system is inspected at predetermined times T1, T2, … . If failure is detected then the system is replaced by a new one, otherwise it is kept operating. The expression of the system time-stationary availability is presented and an algorithm has been developed to generate the inspection sequence which insures a certain availability level. In cases where limited resources restrict the user to predetermined inspection period, the computer program generates the optimal design and operating parameters which will provide the targeted system availability level. A test case is analyzed and potential applications related to automotive industries are mentioned
  • Keywords
    engineering computing; failure analysis; inspection; random processes; reliability; applications; computer program; deterioration process; electromechanical transient shocks; inspection period; inspection sequence generation algorithm; inspection strategy; operating parameters; randomly failing systems; time-stationary availability; Alarm systems; Availability; Electric shock; Inspection; Power system protection; Power system relaying; Power system security; Power system transients; Protective relaying; Testing;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Industrial Electronics, Control, and Instrumentation, 1996., Proceedings of the 1996 IEEE IECON 22nd International Conference on
  • Conference_Location
    Taipei
  • Print_ISBN
    0-7803-2775-6
  • Type

    conf

  • DOI
    10.1109/IECON.1996.571027
  • Filename
    571027