DocumentCode :
2476744
Title :
π-SIFT: A photometric and Scale Invariant Feature Transform
Author :
Park, Jae-Han ; Park, Kyung-Wook ; Baeg, Seung-Ho ; Baeg, Moon-Hong
Author_Institution :
Korea Inst. of Ind. Technol., South Korea
fYear :
2008
fDate :
8-11 Dec. 2008
Firstpage :
1
Lastpage :
4
Abstract :
For many years, various local descriptors that are insensitive to geometric changes such as viewpoint, rotation, and scale changes, have been attracting attention due to their promising performance. However, most existing local descriptors including the SIFT (Scale Invariant Feature Transform) are based on luminance information rather than color information thereby resulting in instability to photometric variations such as shadows, highlights, and illumination changes. In this paper, we propose a novel local descriptor, π-SIFT, that are invariant to both geometric and photometric variations. In order to achieve photometric invariance, we adopt photometric quasi-invariant features based on the dichromatic reflection model. The performance of the proposed descriptor is evaluated with SIFT.
Keywords :
feature extraction; image colour analysis; photometry; π-SIFT; dichromatic reflection model; local descriptors; luminance information; photometric invariance; photometric variations; scale invariant feature transform; Brightness; Computer vision; Erbium; Filters; Light sources; Lighting; Optical reflection; Photometry; Power distribution; Robustness;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Pattern Recognition, 2008. ICPR 2008. 19th International Conference on
Conference_Location :
Tampa, FL
ISSN :
1051-4651
Print_ISBN :
978-1-4244-2174-9
Electronic_ISBN :
1051-4651
Type :
conf
DOI :
10.1109/ICPR.2008.4761181
Filename :
4761181
Link To Document :
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