DocumentCode
2476782
Title
Automated adjustment of aberration correction in scanning confocal microscopy
Author
Yoo, Han Woong ; Verhaegen, Michel ; Van Royen, Martin E. ; Schitter, Georg
Author_Institution
Delft Center for Syst. & Control, Delft Univ. of Technol., Delft, Netherlands
fYear
2012
fDate
13-16 May 2012
Firstpage
1083
Lastpage
1088
Abstract
This contribution demonstrates an automated adjustment of the coverslip correction collar in scanning confocal microscopy to compensate for aberrations caused by coverslip thickness mismatch. An axial image model is derived for filtering the measured axial image to improve the signal to noise ratio. To find the best collar alignment, 70 axial scans equally spaced over the actuation range are recorded and evaluated automatically. The axial scans reveal that different coverslips have a shift of the maximum intensity for optimal imaging along the collar angle. Correction quality such as the maximum intensity or sharpness of the image are examined and used to find the optimal adjustment. The proposed automated correction is demonstrated with two different coverslips and two biological specimen showing the improved resolution of the obtained confocal microscopy images.
Keywords
aberrations; optical images; optical microscopy; aberration correction; automated correction; axial image measurement; coverslip correction collar; coverslip thickness mismatch; optimal adjustment; scanning confocal microscopy; signal-to-noise-ratio improvement; Diffraction; Lenses; Microscopy; Noise; Noise measurement; Optical diffraction;
fLanguage
English
Publisher
ieee
Conference_Titel
Instrumentation and Measurement Technology Conference (I2MTC), 2012 IEEE International
Conference_Location
Graz
ISSN
1091-5281
Print_ISBN
978-1-4577-1773-4
Type
conf
DOI
10.1109/I2MTC.2012.6229195
Filename
6229195
Link To Document