Advanced Technology MMW Seeker Testbed: a multi-technology demonstration sensor

Author

Killen, Gary A.

Author_Institution

Martin Marietta Corp., Orlando, FL, USA

fYear

1989

fDate

29-30 Mar 1989

Firstpage

35

Lastpage

41

Abstract

A description is given of the Advanced Technology Millimeter Wave Seeker Testbed (ATMMWST), which is characterized by: (1) high range resolution (HRR) by using synthetic coherent processing; (2) complete polarization scattering matrix in a circular basis; and (3) dual-plane sum-and-difference monopulse with complex angle processing. The ATMMWST system consists of a seeker, a signal processor, an instrumentation system and data recording system, and an independent line-of-sight reference system (ILOSRS). The system is used in both tower and captive flight programs to collect target signatures and to demonstrate various aspects of the mission scenario. A functional description of the ATMMWST is presented, and attention is given to radar data processing, radar calibration and representation data, and target detection, classification, and identification

Keywords

calibration; pattern recognition; picture processing; radar systems; signal processing equipment; 2D images; 3D images; Advanced Technology Millimeter Wave Seeker Testbed; TV system; captive flight programs; complex angle processing; data recording system; dual-plane sum/difference monopulse; high range resolution; independent LOS reference system; instrumentation system; line-of-sight reference system; multitechnology demonstration sensor; polarization scattering matrix; radar calibration; radar data processing; signal processor; synthetic coherent processing; target classification; target detection; target identification; target signatures; Data processing; Instruments; Millimeter wave radar; Millimeter wave technology; Polarization; Poles and towers; Radar scattering; Signal processing; Signal resolution; Testing;

fLanguage

English

Publisher

ieee

Conference_Titel

Radar Conference, 1989., Proceedings of the 1989 IEEE National

Conference_Location

Dallas, TX

Type

conf

DOI

10.1109/NRC.1989.47612

Filename

47612