Title :
Quantitative analysis of viral persistence and transient viral load rebound from HIV clinical data
Author :
Luo, Rutao ; Piovoso, Michael J. ; Zurakowski, Ryan
Author_Institution :
Electr. & Comput. Eng., Univ. of Delaware, Newark, DE, USA
fDate :
Aug. 30 2011-Sept. 3 2011
Abstract :
Highly active antiretroviral therapy (HAART) suppresses HIV RNA viral load below the limit of detection for many patients. However, clinical data demonstrates that the HIV virus is not eradicated by HAART, even in patients who have had no detectable virus for 7 years [1]. One possible reason is that a stable resting latent reservoir with a long half-life exists in resting memory CD4+T cells [2]. In this paper, we propose a mathematical model with a constant contribution of a stable latent reservoir and identified this constant by using one patient´s data from AutoVac HAART interruption study [3]. Many patients also have transient rebounds of plasma viral RNA (viral blips) under otherwise successful control of the virus by HAART. Activation of latently infected cells can explain these transient rebounds of viral load. Little quantitative analysis about the activation of reservoir has been done based on any clinical experiment data. Here, we model the activation dynamics of the reservoir by a time-independent activation rate and estimate this rate by using the clinical data from the AutoVac HAART interruption study [3].
Keywords :
RNA; cellular biophysics; microorganisms; patient treatment; HIV RNA viral load; activation dynamics; highly active antiretroviral therapy; mathematical model; quantitative analysis; resting memory CD4+T cells; stable resting latent reservoir; time-independent activation rate; transient viral load rebound; viral persistence; Data models; Human immunodeficiency virus; Load modeling; Mathematical model; Medical treatment; Reservoirs; Transient analysis; Antiretroviral Therapy, Highly Active; HIV; HIV Infections; Humans; Immunologic Memory; Viral Load;
Conference_Titel :
Engineering in Medicine and Biology Society, EMBC, 2011 Annual International Conference of the IEEE
Conference_Location :
Boston, MA
Print_ISBN :
978-1-4244-4121-1
Electronic_ISBN :
1557-170X
DOI :
10.1109/IEMBS.2011.6090599