• DocumentCode
    2477452
  • Title

    Estimation of thickness, complex bulk permittivity and surface conductivity using interdigital dielectrometry

  • Author

    Zaretsky, Mark C. ; Li, Patrick ; Melcher, James R.

  • Author_Institution
    Lab. for Electromagn. & Electron. Syst., MIT, Cambridge, MA, USA
  • fYear
    1988
  • fDate
    5-8 June 1988
  • Firstpage
    162
  • Lastpage
    166
  • Abstract
    Theoretical techniques for deducing continuum parameters from the gain-phase response of interdigital electrodes provide a basis for experiments that demonstrate the use of 50- mu m or 1-mm-wavelength interdigitated electrodes for the absolute measurement of: (1) the thickness and voltage of a layer formed by the sedimentation of 41- mu m particles in transformer oil; (2) the thickness and high-frequency bulk permittivity of plasma-deposited bromobenzene and vacuum-deposited parylene, the former in situ; (3) the complex permittivity of transformer oil without and with a parylene layer for passification against adsorption of water; (4) the dispersion of oil-impregnated paper having a finite thickness; and (5) the surface conductivity due to adsorption of water on a silicon dioxide substrate. The frequency range for (3)-(5) is 0.005 Hz to 10 kHz. Difficulties apparently due to charging effects on the integrated circuitry are discussed.<>
  • Keywords
    dielectric measurement; electrical conductivity measurement; permittivity measurement; surface conductivity; thickness measurement; 0.005 Hz to 10 kHz; SiO/sub 2/ substrate; charging effects; complex bulk permittivity; conductivity measurement; dispersion; gain-phase response; interdigital dielectrometry; interdigitated electrodes; oil-impregnated paper; passification; permittivity measurement; plasma-deposited bromobenzene; sedimentation; surface conductivity; thickness measurement; transformer oil; vacuum-deposited parylene; water adsorption; Conductivity measurement; Dispersion; Electrodes; Gain measurement; Oil insulation; Particle measurements; Permittivity measurement; Plasma measurements; Thickness measurement; Vacuum technology;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electrical Insulation, 1988., Conference Record of the 1988 IEEE International Symposium on
  • Conference_Location
    Cambridge, MA, USA
  • ISSN
    1089-084X
  • Type

    conf

  • DOI
    10.1109/ELINSL.1988.13894
  • Filename
    13894