• DocumentCode
    2477507
  • Title

    P2D-3 Performance Evaluation of Neural Network Based Ultrasonic Flaw Detection

  • Author

    Yoon, Sungjoon ; Oruklu, Erdal ; Saniie, Jafar

  • Author_Institution
    Illinois Inst. of Technol., Chicago
  • fYear
    2007
  • fDate
    28-31 Oct. 2007
  • Firstpage
    1579
  • Lastpage
    1582
  • Abstract
    In this study, a robust flaw detection algorithm using Neural Networks (NN) is presented for NDE applications. A three-layer feedforward NN which can perform a complex nonlinear mapping process has been used as a detection processor following the subband decomposition of the measured signal. The neural network architecture is trained to suppress the clutter echoes while maintaining the integrity of flaw echoes. The training process allows the neural network to learn about the statistics and the variation of the clutter signal. The robustness of the NN method is examined through testing materials with different grain sizes and multiple flaws. It has been shown that NN can improve the flaw-to-clutter (FCR) ratio significantly when the input experimental signal has FCR equal to 0 or less. Experimental results show that a typical FCR improvement of 40dB can be achieved using NN post detectors as opposed to 15dB with the conventional techniques including minimum, median, average, geometric mean and polarity detectors. The experimental results also confirm that the NN detector is capable of distinguishing two adjacent flaw echoes whereas the conventional techniques detect the presence of a single anomaly only. Furthermore, due its trainability, NN performs robustly when some of the subband signals used for detection have little or no flaw information.
  • Keywords
    clutter; grain size; neural nets; performance evaluation; ultrasonic materials testing; clutter echoes; grain size; materials testing; neural network; noise figure 15 dB; noise figure 400 dB; nonlinear mapping process; performance evaluation; subband signal decomposition; ultrasonic flaw detection; Detection algorithms; Detectors; Materials testing; Neural networks; Performance evaluation; Robustness; Signal mapping; Signal processing; Statistics; Ultrasonic variables measurement;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Ultrasonics Symposium, 2007. IEEE
  • Conference_Location
    New York, NY
  • ISSN
    1051-0117
  • Print_ISBN
    978-1-4244-1384-3
  • Electronic_ISBN
    1051-0117
  • Type

    conf

  • DOI
    10.1109/ULTSYM.2007.397
  • Filename
    4409970