DocumentCode
2477507
Title
P2D-3 Performance Evaluation of Neural Network Based Ultrasonic Flaw Detection
Author
Yoon, Sungjoon ; Oruklu, Erdal ; Saniie, Jafar
Author_Institution
Illinois Inst. of Technol., Chicago
fYear
2007
fDate
28-31 Oct. 2007
Firstpage
1579
Lastpage
1582
Abstract
In this study, a robust flaw detection algorithm using Neural Networks (NN) is presented for NDE applications. A three-layer feedforward NN which can perform a complex nonlinear mapping process has been used as a detection processor following the subband decomposition of the measured signal. The neural network architecture is trained to suppress the clutter echoes while maintaining the integrity of flaw echoes. The training process allows the neural network to learn about the statistics and the variation of the clutter signal. The robustness of the NN method is examined through testing materials with different grain sizes and multiple flaws. It has been shown that NN can improve the flaw-to-clutter (FCR) ratio significantly when the input experimental signal has FCR equal to 0 or less. Experimental results show that a typical FCR improvement of 40dB can be achieved using NN post detectors as opposed to 15dB with the conventional techniques including minimum, median, average, geometric mean and polarity detectors. The experimental results also confirm that the NN detector is capable of distinguishing two adjacent flaw echoes whereas the conventional techniques detect the presence of a single anomaly only. Furthermore, due its trainability, NN performs robustly when some of the subband signals used for detection have little or no flaw information.
Keywords
clutter; grain size; neural nets; performance evaluation; ultrasonic materials testing; clutter echoes; grain size; materials testing; neural network; noise figure 15 dB; noise figure 400 dB; nonlinear mapping process; performance evaluation; subband signal decomposition; ultrasonic flaw detection; Detection algorithms; Detectors; Materials testing; Neural networks; Performance evaluation; Robustness; Signal mapping; Signal processing; Statistics; Ultrasonic variables measurement;
fLanguage
English
Publisher
ieee
Conference_Titel
Ultrasonics Symposium, 2007. IEEE
Conference_Location
New York, NY
ISSN
1051-0117
Print_ISBN
978-1-4244-1384-3
Electronic_ISBN
1051-0117
Type
conf
DOI
10.1109/ULTSYM.2007.397
Filename
4409970
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