• DocumentCode
    2477513
  • Title

    Dynamics of photorefractive diffraction in KTa/sub 1-x/Nb/sub x/O/sub 3/ crystals

  • Author

    Ye, Peixian ; Yang, Changxi ; Lian, Yingwu ; Wang, Dadi ; Guan, Qingcai ; Jiyang Wang

  • Author_Institution
    Inst. of Phys., Acad. Sinica, Beijing, China
  • fYear
    1993
  • fDate
    15-18 Nov. 1993
  • Firstpage
    315
  • Lastpage
    316
  • Abstract
    Although the photorefractive properties of KTaNbO/sub 3/ (KTN) crystal, one of the first identified photorefractive crystals, have been investigated in more detail in recent years, its photorefractive diffraction dynamics have been rarely studied. However, these studies might be important for understanding the mechanism of the photorefractivity including the need for a complicated photorefractive model and the influences of the internal dc electric field induced during writing with an applied field. In this presentation, our experimental investigations of photorefractive diffraction dynamics during writing, reading and erasing in a cubic KTN crystal will be reported systematically. Here, we studied not only the diffraction from the first-order grating but also the diffraction from the second-order grating.<>
  • Keywords
    diffraction gratings; electro-optical effects; nonlinear optics; photorefractive materials; potassium compounds; refractive index; KTN crystal; KTa/sub 1-x/Nb/sub x/O/sub 3/ crystals; KTaNbO/sub 3/; applied field; complicated photorefractive model; cubic KTN crystal; first-order grating; internal dc electric field induced during writing; photorefractive crystals; photorefractive diffraction; photorefractive diffraction dynamics; photorefractive properties; second-order grating; Crystalline materials; Crystals; Diffraction gratings; Niobium; Photorefractive effect; Photorefractive materials; Physics; Refractive index; Space charge; Writing;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Lasers and Electro-Optics Society Annual Meeting, 1993. LEOS '93 Conference Proceedings. IEEE
  • Conference_Location
    San Jose, CA, USA
  • Print_ISBN
    0-7803-1263-5
  • Type

    conf

  • DOI
    10.1109/LEOS.1993.379033
  • Filename
    379033